A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging

Shared by Miryam Strautkalns, updated on Jun 19, 2013


Author(s) :
J. Celaya, C. Kulkarni, G. Biswas, S. Saha, K. Goebel

A remaining useful life prediction methodology for elec- trolytic capacitors is presented. This methodology is based on the Kalman filter framework and an empirical degradation model. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their criticality in electronics subsystems they are a good can- didate for component level prognostics and health manage- ment. Prognostics provides a way to assess remaining use- ful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. We present here also, experimental results of an accelerated ag- ing test under electrical stresses. The data obtained in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This prelim- inary remaining life prediction algorithm serves as a demon- stration of how prognostics methodologies could be used for electrolytic capacitors. In addition, the use degradation pro- gression data from accelerated aging, provides an avenue for validation of applications of the Kalman filter based prognos- tics methods typically used for remaining useful life predic- tions in other applications.

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